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电子科学专业实验室——微电子器件与芯片测试实验室

发布者:于洪仕 [发表时间]:2020-06-12 [来源]: [浏览次数]:

微电子器件与芯片测试实验室

Microelectronic Device and Chip Testing Laboratory

一款新的器件或集成电路芯片被设计并生产出来,首先须接受验证测试。在这一阶段,将会进行功能测试、以及全面的交流(AC)参数和直流(DC)参数的测试等,也会探测芯片的内部结构。通过验证测试中的参数测试、功能测试、结构性测试,可以诊断和修正系统设计、逻辑设计和物理设计中的错误,为最终规范器件与芯片的电气参数奠定基础。

本实验室主要负责电子元器件、微波集成电路及数字射频集成电路的参数、功能、内部结构等测试任务,承担微电子器件与芯片制作开发等方向的研究任务。

本实验室属电子科学与技术专业实验室,主要用于电子科学与技术专业和电子信息工程专业的课程实验任务,同时承担与微电子器件与芯片测试相关的实训、实践任务,并作为本科生、研究生的大创大赛实践基地,也为教师提供了必要的课题研究基地。

主要实验设备、仪器和实验装置有:PN结温度特性测试仪、单晶少子寿命测试仪、四探针测试仪、半导体特性图示仪、晶闸管伏安特性测试仪、晶闸管准关断时间测试仪等,总价约85万元。

开设课程:微电子器件原理,片上系统,电子材料与元器件,微波集成电路,数字射频集成电路。

When a new device or an IC chip is designed and produced, it must first be verified and tested. In this stage, we will carry out functional tests, as well as comprehensive tests of AC and DC parameters, and also detect the internal structure of the chip. Through the parameter test, function test and structure test in the verification test, the errors in the system design, logic design and physical design can be diagnosed and corrected, which lays the foundation for the final specification of electrical parameters of devices and chips.

The laboratory can test the parameters, functions and internal structures of electronic components, microwave integrated circuits and digital radio frequency integrated circuits, and diagnose and correct errors in system design, logic design and physical design.

This laboratory belongs to the laboratory of Electronic Science and Technology, which is mainly used for the course experiment tasks of Electronic Science and technology and Electronic Information Engineering. Meanwhile, it undertakes the practical training and tasks related to the test of microelectronic devices and chips. It is also an practice base of the innovation competition for undergraduates and postgraduates, and is also a necessary research base for teachers.

The main experimental equipments, instruments and experimental devices are PN junction temperature characteristic tester, single crystal sub life tester, four probe tester, semiconductor characteristic indicator,thyristorvolt ampere characteristic tester, thyristor quasi turn off time tester, etc. The total price is about 850 thousand yuan.

Courses: principles of microelectronic devices, on-chip systems, electronic materials and components, microwave integrated circuits, digital radio frequency integrated circuits. Undertake the relevant practical training and practical tasks in this direction, as well as the major innovation competition task and research task of undergraduate graduate students.