Microelectronic Device and Chip Testing Laboratory
When a new device or an IC chip is designed and produced, it must first be verified and tested. In this stage, we will carry out functional tests, as well as comprehensive tests of AC and DC parameters, and also detect the internal structure of the chip. Through the parameter test, function test and structure test in the verification test, the errors in the system design, logic design and physical design can be diagnosed and corrected, which lays the foundation for the final specification of electrical parameters of devices and chips.
The laboratory can test the parameters, functions and internal structures of electronic components, microwave integrated circuits and digital radio frequency integrated circuits, and diagnose and correct errors in system design, logic design and physical design.
This laboratory belongs to the laboratory of Electronic Science and Technology, which is mainly used for the course experiment tasks of Electronic Science and technology and Electronic Information Engineering. Meanwhile, it undertakes the practical training and tasks related to the test of microelectronic devices and chips. It is also an practice base of the innovation competition for undergraduates and postgraduates, and is also a necessary research base for teachers.
The main experimental equipments, instruments and experimental devices are PN junction temperature characteristic tester, single crystal sub life tester, four probe tester, semiconductor characteristic indicator,thyristorvolt ampere characteristic tester, thyristor quasi turn off time tester, etc. The total price is about 850 thousand yuan.
Courses: principles of microelectronic devices, on-chip systems, electronic materials and components, microwave integrated circuits, digital radio frequency integrated circuits. Undertake the relevant practical training and practical tasks in this direction, as well as the major innovation competition task and research task of undergraduate graduate students.